Testing Technology

Test Station

for vibration analysis of hard-disk drives

The vibrations emitted during the operation of a hard disk are measured at a resolution of 20 nm using a laser vibrometer. The integrated computer controls the entire test run and compiles an automatic measurement protocol.

 

Testing and Sorting Machines

for identification chips

The chips (or "STICKS") are inserted either manually or automatically and are assigned to a measurement cell, tested by high-frequency signal and sorted into three different classes, based on the test results, with an SPC assuming control of the process.

 

 

 

 

 

 

Automatic Test Machine

for ABS sensors

ABS sensors are mounted on a carriage at 10 µm intervals and are brought within working distance of the profile plate. The measurement signals are thereby recorded, evaluated and automatically logged.


Automatic Sorting Machine

for IC chips

The magnetically identified chips are separated using a vibratory feeder and conveyed, in the correct position, to a magnetic system for sorting. The throughput rate is approx. 100,000 an hour.

 

Automatic Test Machine

for diodes

Fastened diodes are contacted and electrically tested during measurement throughput. Unwanted components can then be punched out.

 

Bandwidth Measurements

with CCD camera and slit barrel

The width, length and edge position of fast-running bands are precisely measured and controlled. The operating program based on Windows NT allows for integration in an automatic production control system.

 
 
An der Strusbek 8a, 22926 Ahrensburg. Germany     ·     info@helms-technologie.de     ·     Tel.: +494102/2225-0     ·     Fax: +494102/2225-8